| AVS 65th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 1:20pm | NS+2D+AS+PC-MoA1 Invited Paper A Connection Between Stability of STM Control System and Local Barrier Height: Implications on Imaging and Lithography S.O. Reza Moheimani, University of Texas at Dallas |
| 2:00pm | NS+2D+AS+PC-MoA3 Distinctive Microstructures in a Complex Polymer Evolve with Time and Composition x. Yu, Worcester Polytechnic Institute, S. Granados-Focil, Clark University, M. Tao, Nancy Burnham, Worcester Polytechnic Institute |
| 2:20pm | NS+2D+AS+PC-MoA4 Offering new Characterization Capabilities at the XTIP beamline by Combining Scanning Tunneling Microscopy with Synchrotron Radiation Volker Rose, H. Chang, M. Fisher, S.W. Hla, N. Shirato, Argonne National Laboratory |
| 2:40pm | NS+2D+AS+PC-MoA5 Invited Paper Scanning Probe Microscopy Based Spectroscopy Measurement for Nanoscale Chemical Identification Chanmin Su, Bruker-Nano, Inc. |
| 3:40pm | NS+2D+AS+PC-MoA8 Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-based Sensors: An Analysis O.E. Dagdeviren, C. Zhou, E.I. Altman, Udo D. Schwarz, Yale University |
| 4:00pm | NS+2D+AS+PC-MoA9 AFM + Nanoscale Vis-IR Spectroscopy via Photo-induced Force Microscopy Derek Nowak, T. Albrecht, S. Park, Molecular Vista |