| AVS 65th International Symposium & Exhibition | |
| Nanometer-scale Science and Technology Division | Monday Sessions |
| Session NS+2D+AS+PC-MoA |
| Session: | SPM - New Imaging and Spectroscopy Methodologies |
| Presenter: | Volker Rose, Argonne National Laboratory |
| Authors: | V. Rose, Argonne National Laboratory H. Chang, Argonne National Laboratory M. Fisher, Argonne National Laboratory S.W. Hla, Argonne National Laboratory N. Shirato, Argonne National Laboratory |
| Correspondent: | Click to Email |
The race is on for chemical x-ray imaging with nanoscale resolution. Specifically, there are currently substantial efforts underway at synchrotron facilities worldwide that aim to combine x-rays with scanning probe microscopy. Recently, substantial progress was made on Argonne’s Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) project. SX-STM enables an entirely new view into the nanoworld by combining the best of two worlds: the exceptional chemical, magnetic, and structural sensitivity of synchrotron x-rays combined with the high spatial resolution of scanning probe microscopy accompanied by its ability to engineer and manipulate surfaces down to the level of single atoms.
To fully exploit the special capabilities of a unique new cryogenic x-ray microscope, XTIP, a dedicated beamline for SX-STM will become available at the Advanced Photon Source in early 2019. To meet the scientific objective of the nanoscience and nanomagnetism communities most effectively, we are going to build a soft x-ray beamline with full polarization control operating over the 500-1600 eV energy range. The dedicated XTIP beamline will provide researchers access to a one-of-a-kind instrument. Among the potential breakthroughs are “designer” materials created from controlled assembly of atoms and molecules, and the emergence of entirely new phenomena in chemistry and physics.