| AVS 65th International Symposium & Exhibition | |
| Applied Surface Science Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 1:20pm | AS-MoA1 Overcoming Obstacles in Surface and Interface Characterization of All Solid-State Lithium Battery Materials Natalie Seitzman, Colorado School of Mines, H. Guthrey, D. Sulas, S. Johnston, National Renewable Energy Laboratory, J. Nelson Weker, SLAC National Accelerator Laboratory, H. Platt, Solid Power, Inc., M. Al-Jassim, National Renewable Energy Laboratory, S. Pylypenko, Colorado School of Mines |
| 1:40pm | AS-MoA2 In-situ Complementary XPS and Raman Analysis of Technologically Important Materials Paul Mack, Thermo Fisher Scientific, UK |
| 2:00pm | AS-MoA3 Invited Paper Integration of Laboratory Experiments. Spectroscopy, and Microscopy to Investigate the Reactivity of Metals in Mine Wastes José Cerrato, University of New Mexico |
| 3:00pm | AS-MoA6 Surface Phase, Morphology, and Charge Distribution Transitions on Vacuum and Ambient Annealed Perovskites: A Case Study on SrTiO3(100) Omur Dagdeviren, G. Simon, K. Zou, C. Ahn, F.J. Walker, E.I. Altman, U.D. Schwarz, Yale University |
| 3:40pm | AS-MoA8 In-situ Characterisation of Graphene using combined XPS and Raman Spectroscopy: Removal of Polymer Residue by Ar Gas Cluster Ion Beams Barry Brennan, National Physical Laboratory, UK, P. Mack, Thermo Fisher Scientific, UK, A. Centeno, A. Zurutuza, Graphenea, Spain, A.J. Pollard, National Physical Laboratory, UK |
| 4:00pm | AS-MoA9 Topography-corrected TOF-SIMS Chemical Imaging of Chip Interconnect Surfaces Conor Thomas, B. Singh, R. Wang, IBM Systems Division |
| 4:20pm | AS-MoA10 Combining the Benefits of GCIB-ToF-SIMS, MALDI-FTICR-MS and LC-MS/MS for Location specific Lipid Identification in Planarian Flatworm Tissue Sections Tina Angerer, University of Washington, D. Velickovic, C. Nicora, C.R. Anderton, Pacific Northwest National Laboratory, D.J. Graham, L.J. Gamble, University of Washington |