AVS 65th International Symposium & Exhibition, Session AS+BI-TuM

AVS 65th International Symposium & Exhibition
Applied Surface Science Division	Tuesday Sessions

Session AS+BI-TuM
Applied Surface Science: From Electrochemistry to Cell Imaging, a Celebration of the Career of Nicholas Winograd

Tuesday, October 23, 2018, 8:00 am, Room 204
Moderators: Arnaud Delcorte, Université Catholique de Louvain, Belgium, Michaeleen Pacholski, The Dow Chemical Company

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:00am	AS+BI-TuM1 Invited Paper Surface Analysis and Beyond, Using Ion Beams and Lasers Nicholas Lockyer, J.C. Vickerman, University of Manchester, UK
8:40am	AS+BI-TuM3 A High Resolution Tandem MS Imaging Method to Probe the Composition of Organelles in Single Cells Gregory L. Fisher, Physical Electronics, C.E. Chini, University of Illinois at Urbana-Champaign, B. Johnson, M.M. Tamkun, Colorado State University, M.L. Kraft, University of Illinois at Urbana-Champaign
9:00am	AS+BI-TuM4 SIMS and MALDI-MS. Competitive, Complimentary or Complementary Techniques for Bio-imaging? John Stephen Fletcher, I. Kaya, University of Gothenburg, Sweden
9:20am	AS+BI-TuM5 High Spatial Resolution Metabolic Imaging using the 3D OrbiSIMS - Fundamentals of Metabolite Fragmentation and Biological Applications C. Newell, Y. Panina, Francis Crick Institute, UK, L. Matjacic, V. Cristaudo, National Physical Laboratory, UK, A.P. Bailey, Francis Crick Institute, UK, R. Havelund, National Physical Laboratory, UK, M. Yuneva, A.P. Gould, Francis Crick Institute, UK, Ian S. Gilmore, National Physical Laboratory, UK
9:40am	AS+BI-TuM6 Small Molecule Imaging in Single Frozen-Hydrated Cells using High-Resolution Gas Cluster Ion Beam Secondary Ion Mass Spectrometry (GCIB-SIMS) Hua Tian, N. Winograd, Pennsylvania State Univeristy
11:00am	AS+BI-TuM10 Invited Paper Pushing the Limits of Measurement Science with SIMS Christopher Szakal, D.S. Simons, J.D. Fassett, T.P. Forbes, National Institute of Standards and Technology (NIST)
11:40am	AS+BI-TuM12 Multiplexed Ion Beam Imaging: Cell and Tissue Imaging using Secondary Ion Mass Spectrometry for Pathology Jay Tarolli, R. Finck, M. Aksoy, D. Stumbo, Ionpath, Inc.
12:00pm	AS+BI-TuM13 Combined ToF-SIMS and AFM Protocol for Accurate 3D Chemical Analysis and Data Visualization Maiglid Andreina Moreno Villavicencio, N. Chevalier, J.-P. Barnes, I. Mouton, Univ. Grenoble Alpes, CEA, LETI, France, F. Bassani, Univ. Grenoble Alpes, CNRS, LTM, France, B. Gautier, Université de Lyon, INSA Lyon, Institut des Nanotechnologies de Lyon, UMR CNRS 5270, F- 69621 Villeurbanne cedex, France