AVS 65th International Symposium & Exhibition
    Applied Surface Science Division Tuesday Sessions
       Session AS+BI-TuM

Invited Paper AS+BI-TuM10
Pushing the Limits of Measurement Science with SIMS

Tuesday, October 23, 2018, 11:00 am, Room 204

Session: Applied Surface Science: From Electrochemistry to Cell Imaging, a Celebration of the Career of Nicholas Winograd
Presenter: Christopher Szakal, National Institute of Standards and Technology (NIST)
Authors: C. Szakal, National Institute of Standards and Technology (NIST)
D.S. Simons, National Institute of Standards and Technology (NIST)
J.D. Fassett, National Institute of Standards and Technology (NIST)
T.P. Forbes, National Institute of Standards and Technology (NIST)
Correspondent: Click to Email
The career of Dr. Nicholas Winograd was exemplified by an unwillingness to accept the scientific status quo. Both in words and actions, he set a tone that encouraged everyone he worked with to ‘push the limits’ of what they thought was possible within their research endeavors. In this presentation, several topics will be explored where this mindset has been directly put into practice. A mix of historical examples, recent advancements, and new science that fit within the theme will be presented. Specifically, topics related to cluster ion beams, single cell imaging, single cell quantification, precision isotopic measurements, secondary ion mass spectrometry (SIMS) standard generation, and precision atmospheric pressure ionization MS measurements will be described in terms of how the measurement science boundaries were assertively targeted. Since Dr. Winograd had a fondness for cutting-edge instrumentation throughout his career, the presented efforts will focus on pushing the limits within time-of-flight (TOF)-SIMS, large geometry (LG)-SIMS, and ultra-high-resolution (UHR)-MS quadrupole(Q)-TOF technologies.