AVS 63rd International Symposium & Exhibition
Click a session title to see the papers
| Start Time | Session Code | Session Title |
|---|---|---|
| Thursday 2:20pm | EL+AS+BI+EM+TF-ThA | Optical Characterization of Nanostructures and Metamaterials (2:20-3:40 pm)/Application of Spectroscopic Ellipsometry for the Characterization of Thin Films (4:00-6:00 pm) and Biological Materials Interfaces |
| Thursday 6:00pm | EL+AS+EM+TF-ThP | Spectroscopic Ellipsometry Poster Session |
| Friday 8:20am | EL+AS+EM+MI+TF-FrM | Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches |