| AVS 63rd International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| EL+AS+EM+TF-ThP1 FTIR Ellipsometry Studies of Thermally Grown GeO2 on Ge Jaime Moya, T.N. Nunley, N.S. Fernando, N. Samarasingha, S. Zollner, New Mexico State University |
| EL+AS+EM+TF-ThP2 Anisotropic Bruggeman Effective Medium Approach for Modeling Spectroscopic Ellipsometry Data of Porous Samples Stefan Schöeche, J. VanDerslice, J.A. Woollam, J.A. Woollam Co., Inc. |
| EL+AS+EM+TF-ThP3 Optical Constants of M2-phase VO2 Measured by Spectroscopic Ellipsometry SamuelT. White, R.F. Haglund, K. Hallman, Vanderbilt University |