| AVS 63rd International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | EL+AS+BI+EM+TF-ThA1 Invited Paper Optical Properties of (Self-assembled) Nanostructured Surfaces Studied by Spectroscopic Mueller Matrix Ellipsometry and Local Direct Imaging Techniques Morten Kildemo, Norwegian University of Science and Technology, Norway |
| 3:00pm | EL+AS+BI+EM+TF-ThA3 Optical Properties of Nanocrystalline Si3N4:TiN Thin Films Neil Murphy, Air Force Research Laboratory, L. Sun, General Dynamics Information Technology, J.G. Jones, Air Force Research Laboratory, J.T. Grant, Azimuth Corporation |
| 3:20pm | EL+AS+BI+EM+TF-ThA4 The Effect of Aluminum Content on Properties of Al-doped Zinc Oxide Thin Films Grown at Room Temperature Lirong Sun, General Dynamics Information Technology, N.R. Murphy, Air Force Research Laboratory, J.T. Grant, Azimuth Corporation, J.G. Jones, Air Force Research Laboratory |
| 4:00pm | EL+AS+BI+EM+TF-ThA6 Invited Paper Optical Monitoring of Growth (and Death) of Thin Film Materials for Solar Cells Nikolas Podraza, K. Ghimire, M.M. Junda, A.A. Ibdah, P. Koirala, University of Toledo, S. Marsillac, Old Dominion University, R.W. Collins, Y. Yan, University of Toledo |
| 4:40pm | EL+AS+BI+EM+TF-ThA8 Monitoring Nanometer-Thin Film Formation using Ellipsometry Bert Müller, F.M. Weiss, T. Töpper, B. Osmani, University of Basel, Switzerland |
| 5:00pm | EL+AS+BI+EM+TF-ThA9 Optical Determination of Electrical Response for Thin Film Transparent Conductors: Spectral Range Dependence Prakash Uprety, M.M. Junda, K. Lambright, R. Khanal, A. Phillips, M. Heben, D. Giolando, N.J. Podraza, University of Toledo |
| 5:20pm | EL+AS+BI+EM+TF-ThA10 Spectroscopic Ellipsometry Studies of CdS-CdSe-CdTe Alloys: Applications in Thin Film Solar Cells Maxwell Junda, C.R. Grice, Y. Yan, N.J. Podraza, University of Toledo |
| 5:40pm | EL+AS+BI+EM+TF-ThA11 Development of Growth Evolution Diagrams for RF Sputtered Nanocrystalline Hydrogenated Silicon Thin Films via Real Time Spectroscopic Ellipsometry Dipendra Adhikari, M. M. Junda, N. J. Podraza, University of Toledo |