AVS 63rd International Symposium & Exhibition, Session EL+AS+EM+MI+TF-FrM

AVS 63rd International Symposium & Exhibition
Spectroscopic Ellipsometry Focus Topic	Friday Sessions

Session EL+AS+EM+MI+TF-FrM
Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches

Friday, November 11, 2016, 8:20 am, Room 104C
Moderators: Morten Kildemo, Norwegian University of Science and Technology, Nikolas Podraza, University of Toledo

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:20am	EL+AS+EM+MI+TF-FrM1 Invited Paper Magnetoopticalproperties of Metals, Half-Metals, and Garnets Probed by Vector-Magneto-Optical Generalized Ellipsometry Heidemarie Schmidt, Technische Universität Chemnitz, Nano-Spintronics Group, Germany
9:00am	EL+AS+EM+MI+TF-FrM3 In Situ Terahertz Optical Hall Effect Measurements of Ambient Doping Effects in Epitaxial Graphene S. Knight, University of Nebraska-Lincoln, C. Bouhafs, N. Armakavicius, P. Kühne, V. Stanishev, R. Yakimova, Linköping University, Sweden, S. Wimer, M. Schubert, University of Nebraska-Lincoln, V. Darakchieva, Linköping University, Sweden, Tino Hofmann, University of North Carolina at Charlotte
9:20am	EL+AS+EM+MI+TF-FrM4 Excitons at Interfaces in Ellipsometric Spectra Nuwanjula Samarasingha, C. Rodriguez, J.M. Moya, N.S. Fernando, S. Zollner, New Mexico State University, P. Ponath, K. Kormondy, A. Demkov, University of Texas at Austin, D. Pal, A. Mathur, A. Singh, S. Dutta, J. Singhal, S. Chattopadhyay, Indian Institute of Technology Indore, India
9:40am	EL+AS+EM+MI+TF-FrM5 Infrared and Visible Dielectric Properties of (LaAlO₃)_0.3(Sr₂AlTaO₆)_0.35 Jacqueline Cooke, N.T. Nunley, T. Willett-Gies, S. Zollner, New Mexico State University
10:00am	EL+AS+EM+MI+TF-FrM6 A New Constant of Product of Electronic Scattering Time and Resistivity in Thin Silver Refractive Index Calculation from Ellipsometry and Resistivity Measurements Guowen Ding, C. Clavero, D. Schweigert, M. Le, Intermolecular, Inc.
10:20am	EL+AS+EM+MI+TF-FrM7 Realization of an In Situ Mueller-matrix Imaging Ellipsometer for the Real Time Observation of Surface Properties in an Ultra-high Vacuum EUV Facility Pim Muilwijk, N.B. Koster, F.T. Molkenboer, E. Sligte, te, A.F. Deutz, P. Walle, van der, TNO Technical Sciences, Netherlands
10:40am	EL+AS+EM+MI+TF-FrM8 Conducting, Semi-Conducting and Insulating 2D-Materials Characterized by Spectroscopic Imaging Ellipsometry Matthias Duwe, S. Funke, Accurion GmbH, Germany, U. Wurstbauer, Technical University of Munich, Germany, A. Matkovic, University of Belgrade, Serbia, A. Green, SUNY College of Nanoscale Science and Engineering, A. Molina-Mendoza, Universidad Autonoma de Madrid, Spain, A. Castellanos-Gomez, IMDEA Nanoscience, Spain, P.H. Thiesen, Accurion GmbH, Germany