AVS 63rd International Symposium & Exhibition, Session TF1-ThM

AVS 63rd International Symposium & Exhibition
Thin Film	Thursday Sessions

Session TF1-ThM
Control and Modeling of Thin Film Growth and Film Characterization

Thursday, November 10, 2016, 8:00 am, Room 104E
Moderators: Berc Kalanyan, National Institute of Standards and Technology (NIST), Richard Vanfleet, Brigham Young University

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:00am	TF1-ThM1 Invited Paper Adventures in Group IV Ordering: Super-periodicities at the Atomic/Nano/Meso/scale Jerrold Floro, J. Amatya, C. Duska, C.W. Petz, University of Virginia, D. Yang, J. Levy, University of Pittsburgh
8:40am	TF1-ThM3 Combinatorial Fabrication of Cu-Fe₂O₃ Composite Nanostructures by Oblique Angle Co-Deposition S. Larson, W.J. Huang, Yiping Zhao, University of Georgia
9:00am	TF1-ThM4 Structural and Electronic Properties of Titanium Doped Ga₂O₃Thin Films Sandeep Manandhar, E. Rubio, C.V. Ramana, The University of Texas at El Paso
9:20am	TF1-ThM5 Characterizing Patterns and Order in Self-Assembled Langmuir Films of Quantum Dots Zachary Whitfield, J.J. Weimer, University of Alabama in Huntsville
9:40am	TF1-ThM6 Radical-Based MBE Growth, Structure, Defects and Transport in High-Mobility Epitaxial La-doped BaSnO₃ Films A. Prakash, P. Xu, J. Dewey, Bharat Jalan, University of Minnesota
11:00am	TF1-ThM10 Reduction of Extended Defects in SiC Epilayers Grown on 2° Offcut Substrates Rachael Myers-Ward, N. Mahadik, R. Stahlbush, P. Klein, K.M. Daniels, A. Boyd, K. Gaskill, Naval Research Laboratory
11:20am	TF1-ThM11 Modeling the Structure and Medium Range order of ALD Amorphous Oxide Thin Films Angel Yanguas-Gil, J.W. Elam, Argonne National Laboratory
11:40am	TF1-ThM12 From Nano-porosity to Macro-scale Defects: Ellipsometric Porosimetry and Electrochemical Impedance Spectroscopy Characterization of Thin Inorganic Films Alberto Perrotta, W.M.M. Kessels, M. Creatore, Eindhoven University of Technology, Netherlands
12:00pm	TF1-ThM13 Thermal Conductivity and Mechanical Properties of AlN-based Thin Films Vincent Moraes, H. Riedl, Technische Universität Wien, Austria, H. Bolvardi, Oerlikon Balzers, Liechtenstein, S. Kolozsvári, Plansee Composite Materials GmbH, Germany, M. Ikeda, L. Prochaska, S. Paschen, P.H. Mayrhofer, Technische Universität Wien, Austria