| AVS 63rd International Symposium & Exhibition | |
| Thin Film | Thursday Sessions |
| Session TF1-ThM |
| Session: | Control and Modeling of Thin Film Growth and Film Characterization |
| Presenter: | Zachary Whitfield, University of Alabama in Huntsville |
| Authors: | Z. Whitfield, University of Alabama in Huntsville J.J. Weimer, University of Alabama in Huntsville |
| Correspondent: | Click to Email |
The goal of this analytical study is to establish methods to quantify the uniformity of self-assembled Langmuir monolayers of quantum dots (QDs) in an efficient and reliable manner. Gradient-core quantum dots (QDs) were selected for creating the thin films because of their growing popularity for use in industries. The QDs were cast as Langmuir films on a water subphase, and the Langmuir films were deposited onto substrates using the Langmuir-Schafer (LS) technique. Images were taken using an iSight digital camera of both the Langmuir and LS films with a black light source. Agglomerations, voids, islands, and ridges were some of the artifacts found when surveying the Langmuir films. These artifacts were seen to template directly to the LS films. Emission spectra of the LS films were mapped using fluorescence spectroscopy. Scanning probe microscopy was also performed to study surface morphology of samples. Image processing software was used to quantify the intensities of the variations at different spatial locations across the films. A direct correlation was made between the spatial variations in image brightness and the intensities of fluorescence spectra at the same given point on the LS films.