| AVS 63rd International Symposium & Exhibition | |
| MEMS and NEMS | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | MN+MS-FrM1 Radiation Effects in Emerging MEMS/NEMS Devices Jacob Calkins, Defense Threat Reduction Agency |
| 8:40am | MN+MS-FrM2 Invited Paper Effect of Top Electrode Material on Radiation-Induced Degradation of Ferroelectric Thin Films Nazanin Bassiri-Gharb, S.J. Brewer, C.Z. Deng, C.P. Callaway, Georgia Institute of Technology, M.K. Paul, Woodward Academy, K.J. Fisher, Riverwood International Charter School, J.E. Guerrier, J.L. Jones, North Carolina State University, R.Q. Rudy, R.G. Polcawich, Army Research Laboratory, E.R. Glaser, C.D. Cress, Naval Research Laboratory |
| 9:20am | MN+MS-FrM4 Invited Paper Radiation Survivability of MEMS Microelectronic Circuits with CNT Field Emitters Jason Amsden, E.J. Radauscher, T. von Windheim, Duke University, K.H. Gilchrist, RTI International, S.T. Di Dona, Z.E. Russell, Duke University, L.Z. Scheick, Jet Propulsion Laboratory, California Institute of Technology, J.R. Piascik, RTI International, C.B. Parker, Duke University, B.R. Stoner, RTI International, J.T. Glass, Duke University |
| 10:00am | MN+MS-FrM6 Invited Paper Radiation Effects in Integrated Photonics and Nano-OptoMechanical Systems Q. Du, Massachusetts Institute of Technology, B Li, University of Minnesota, D. Ma, A. Agarwal, Juejun Hu, Massachusetts Institute of Technology, M. Li, University of Minnesota |
| 10:40am | MN+MS-FrM8 Invited Paper Radiation Effects in 2D Materials and Nano Electrical Mechanical Devices Michael Alles, K.I. Bolotin, Vanderbilt University, A. Zettl, University of California at Berkeley, B. Homeijer, Sandia National Laboratories, J.L. Davidson, R.D. Schrimpf, R.A. Reed, R.A. Weller, D.M. Fleetwood, W. Liao, R.J. Nicholl, Vanderbilt University |
| 11:20am | MN+MS-FrM10 Invited Paper Influence of Radiation on MEMS Oscillators Bruce Alphenaar, University of Louisville, M.L. Alles, H. Gong, Vanderbilt University, P. Deb Shurva, J.T. Lin, University of Louisville, J.L. Davidson, Vanderbilt University, S. McNamara, K. Walsh, University of Louisville, W. Liao, R.A. Reed, Vanderbilt University |
| 12:00pm | MN+MS-FrM12 Radiation Effects on Silicon Carbide (SiC) Nanomechanical Devices Philip Feng, Case Western Reserve University |