| AVS 63rd International Symposium & Exhibition | |
| Advanced Ion Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | HI-WeA1 Invited Paper A Spectacular Collision of Entrepreneurial Spirit and a Doomed Technology… Transforming the Impossible into the Helium Ion Microscope Bill Ward, Entrepreneur, Scientist, Inventor, and Consultant |
| 3:00pm | HI-WeA3 Recent Developments of the Gas Field Ion Source John A. Notte, Carl Zeiss Microscopy, LLC |
| 3:20pm | HI-WeA4 Monte-Carlo Simulations of Ion Beam Milling in Compound Targets Kyle Mahady, P.D. Rack, University of Tennessee, S. Tan, R.H. Livengood, Y. Greenzweig, A. Raveh, Intel Corporation |
| 4:20pm | HI-WeA7 Characterization of Structural Changes During HIM and SEM Imaging of Organic Films Shinichi Ogawa, National Institute of Advanced Industrial Science and Technology (AIST), Japan, T. Ohashi, S. Oyama, Nissan Chemical Industries, Ltd. |
| 4:40pm | HI-WeA8 Laser-Assisted Focused Helium and Neon Beam Induced Processing M.G. Stanford, The University of Tennessee Knoxville, S. Tan, R.H. Livengood, Intel Corporation, B.B. Lewis, University of Tennessee Knoxville, J.D. Fowlkes, Center for Nanophase Materials Sciences, Oak Ridge National Lab, Philip D. Rack, The University of Tennessee Knoxville |
| 5:00pm | HI-WeA9 Invited Paper Imaging and Lithography of Two-Dimensional Nanostructures with Helium Ions André Beyer, Bielefeld University, Germany |
| 5:40pm | HI-WeA11 High Resolution Elemental Imaging on the Helium Ion Microscope David Dowsett, J.-N. Audinot, F. Vollnhals, T. Wirtz, Luxembourg Institute of Science and Technology (LIST), Luxembourg |