| AVS 63rd International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-TuP2 Observing the Effects of Jetting from Sputtering with Both Monatomic Argon and Argon Gas Clusters of Multi-layered Samples Using XPS with Rapid Mapping Timothy Nunney, Thermo Fisher Scientific, UK, R. Simpson, University of Surrey, UK, C. Deeks, P. Mack, J.P.W. Treacy, Thermo Fisher Scientific, UK |
| AS-TuP3 Multitechnique Surface Analysis for Advanced Microelectronics Materials James Lallo, Thermo Fisher Scientific, C. Deeks, P. Mack, T.S. Nunney, J.P.W. Treacy, Thermo Fisher Scientific, UK |
| AS-TuP4 Surface Analysis of Human Hair – a Multi-technique Approach Sarah Coultas, J.D.P. Counsell, C.J. Blomfield, Kratos Analytical Limited, UK, M. Openshaw, Shimadzu - MALDI Technologies Group, C. Moffitt, Kratos Analytical Inc. |
| AS-TuP5 Exploring the Surface and Sub-Surface Nature of Nuclear Graphite J.D.P. Counsell, S.J. Coultas, C.J. Blomfield, Kratos Analytical Limited, UK, Chris Moffitt, Kratos Analytical Limited, A. Theodosiou, University of Manchester |
| AS-TuP6 Comparison of Angle Resolved XPS and Ultra-shallow Ar Gas Cluster Depth Profiling of Organometallic Multilayer Materials Simon Hutton, Kratos Analytical Limited, UK, T. Bendikov, Weizmann Institute of Science, Israel, K. Macak, W. Boxford, S.C. Page, S.J. Coultas, C.J. Blomfield, J.D.P. Counsell, Kratos Analytical Limited, UK |
| AS-TuP7 Pd deposited on Al2O3 analyzed by Low Energy Ion Scattering (LEIS) P. Bruener, T. Grehl, ION-TOF GmbH, Germany, Nathan Havercroft, ION-TOF USA, J.Z. Mundy, G.N. Parsons, North Carolina State University |
| AS-TuP8 Real-time Monitoring of Surface Reactions by Means of Cluster-induced Desorption/Ionization Mass Spectrometry A. Portz, Justus Liebig University Giessen, Germany, ChristophR. Gebhardt, Bruker Daltonics Bremen, Germany, M. Durr, Justus Liebig University Giessen, Germany |
| AS-TuP9 Improved X-ray Photoelectron Spectroscopy Analysis using the PHI VersaProbe III J. Newman, Jennifer Mann, J.S. Hammond, J.F. Moulder, B. Schmidt, Physical Electronics USA |
| AS-TuP10 Multiple Technique Investigation of UV-grafted Polymers Lopamudra Das, M.J. Kelley, College of William and Mary |
| AS-TuP11 Analysis of Thin Phase-Shifter Films using Surface Analysis Techniques Vincent Smentkowski, General Electric Global Research Center, L. Le Tarte, GGeneral Electric Global Research Center, H. Piao, General Electric Global Research Center, M. Marko, Wadsworth Center |
| AS-TuP12 Improving the Performance of the Cylindrical Mirror Analyzer by Electrode Segmentation David Edwards, Jr, IJL Research Center |
| AS-TuP15 Impact of Surface Contaminants on ToF-SIMS analysis of Wood Polymer Composites (WPCs) Laura D. Brunelle, Z.A. Gernold, C.S. Swagler, E.R. Welton, R.E. Goacher, Niagara University |
| AS-TuP16 Examining the General Applicability of ToF-SIMS for Wood Polymer Composite (WPC) Analysis Christopher S. Swagler, L.D. Brunelle, M.R. Michienzi, E.R. Welton, R.E. Goacher, Niagara University |
| AS-TuP17 Swift Heavy Ion Irradiation for Designing Planar Field Emitters and Exchange Bias Layers Debalaya Sarker, S. Bhattacharya, Indian Institute of Technology Delhi, India, S. Ghosh, P. Srivastava, Indian Institute of Technology Delhi |
| AS-TuP18 Improving Relative Quantitation in Imaging Lipidomics using ToF-SIMS Marwa Munem, J.S. Fletcher, University of Gothenburg, Sweden |
| AS-TuP19 XPS Investigation of UHP Mg and Mg Alloys Exposed to Water: Peak Fitting the Mg 2p Core Level Spectra to Distinguish Oxide from Hydroxide Harry Meyer, D. Leonard, M.P. Brady, Oak Ridge National Laboratory |
| AS-TuP20 Root-Cause Analysis of an Interfacial Adhesive Failure Based on Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) James Ohlhausen, P. Vianco, Sandia National Laboratories |
| AS-TuP21 Surface and Bulk Property Studies of Newly Developed High Performance Transparent Conductor Material Lei Zhang, W. Wu, N.G. Tassi, D. Walls, DuPont Science and Engineering |
| AS-TuP22 Optimizing the Surface of Perovskite Oxide/Carbon Composites as Catalysts for the Oxygen Reduction Reaction in Alkaline Media Michael Dzara, C. Ngo, Colorado School of Mines, J. Christ, National Renewable Energy Laboratory, P. Joghee, C. Cadigan, T. Batson, R. Richards, R. O'Hayre, S. Pylypenko, Colorado School of Mines |
| AS-TuP23 Tuning of N-Doping in Carbon Nanospheres for Investigation of Catalyst-Support Interactions Matthew Strand, C. Ngo, A. White, J. Hagen, S. Pylypenko, Colorado School of Mines |
| AS-TuP24 Electron Microscopy Study of Fission Product Migration in Irradiated TRISO Nuclear Fuel Rachel Seibert, Illinois Institute of Technology, C. Parish, P. Edmondson, K. Terrani, Oak Ridge National Laboratory, J. Terry, Illinois Institute of Technology |
| AS-TuP26 X-ray Photoelectron Spectroscopy Analysis of Titanium Nitride-Nickel Nanocomposite Catalyst Samuel Gage, Colorado School of Mines, V. Molinari, D. Esposito, Max Planck Institute of Colloids and Interfaces, Germany, S. Pylypenko, Colorado School of Mines |
| AS-TuP27 Redox Active Cerium Oxide Immobilized on Highly Ordered Polymer Nanopillars as Dopamine Sensor Swetha Barkam, M. Peppler, S. Das, S. Saraf, C. Li, J. Thomas, S. Seal, University of Central Florida |
| AS-TuP28 X-ray Photoelectron Spectroscopy of Raw Material for Metal Additive Manufacturing David Wieliczka, A.S. Choi, J.A. Crow, C.J. Cook, L.F. Elder, R.D. Koch, T.A. Pond, B.C. Sartin, D.R. Shinault, S.E. Van Slyke, Honeywell Federal Manufacturing and Technology |
| AS-TuP29 Characterization of Bonding between Super-hard Ceramics and Polymer Substrate Ranganathan Parthasarathy, Tennessee State University, JB. Beam, Vanderbilt University, FEH. Hoff, Tennessee State University, A. Misra, University of Kansas, L.Z. Ouyang, Tennessee State University, CML. Lukehart, Vanderbilt University |