Paper AS-TuP9
Improved X-ray Photoelectron Spectroscopy Analysis using the PHI VersaProbe III

Tuesday, November 8, 2016, 6:30 pm, Room Hall D

Based on its proven scanning X-ray Photoelectron Spectroscopy (XPS) microprobe core technology, Physical Electronics has introduced the newest version of its VersaProbe product line; the VersaProbe III. Multiple improvements over the VersaProbe II model have been incorporated into this new design including:

• Higher sensitivity for all analysis areas
• Increased number of detector channels for faster imaging
• Collection angle defining aperture for angle dependent studies
• Improved hot/cold stage temperature range
• Dedicated high temperature mount for increased temperature experiments
• Dedicated 4-contact sample mount for in-situ controlled potential experiments

This poster will discuss these improvements in more detail and show examples where they are beneficial in XPS experiments.