| AVS 62nd International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | SP+AS+NS+SS-WeM1 Invited Paper Designer Electrons: Quantum Information and New Particles in Atomically Assembled Matter Hari Manoharan, Stanford University |
| 8:40am | SP+AS+NS+SS-WeM3 Scanning Quantum Dot Microscopy Ruslan Temirov, C.W. Wagner, M.F.B.G. Green, P.L. Leinen, Forschungszentrum Juelich GmbH, Germany, T.D. Deilmann, P. Krueger, M.R. Rohlfing, Muenster University, Germany, F.S.T. Tautz, Forschungszentrum Juelich GmbH, Germany |
| 9:00am | SP+AS+NS+SS-WeM4 Local Probing of the Photo-carrier Lifetime by Kelvin Probe Force Microscopy Nicolas Chevalier, S. Pouch, D. Mariolle, Univ. Grenoble Alpes/ CEA, LETI, MINATEC Campus, France, B. Grevin, Univ. Grenoble Alpes/ CEA, INAC, SPrAM, LEMOH, France, Ł. Borowik, Univ. Grenoble Alpes/ CEA, LETI, MINATEC Campus, France |
| 9:20am | SP+AS+NS+SS-WeM5 Nanoscale Capacitance-Voltage (C-V) Curves: Using Scanning Microwave Impedance Microscopy (sMIM) to Characterize Local Electrical Properties of Linear and Non-Linear Materials Stuart Friedman, Y. Yang, O. Amster, PrimeNano, Inc. |
| 9:40am | SP+AS+NS+SS-WeM6 STM Study of the Correlation between Structural, Magnetic, and Electronic Properties of Co Nano-Islands on Cu(111) Jewook Park, C. Park, M. Yoon, Z. Gai, A.P. Baddorf, A.-P. Li, Oak Ridge National Laboratory |
| 11:00am | SP+AS+NS+SS-WeM10 Invited Paper Probing Electrostatic Field Effect in Quantum Materials by Microwave Impedance Microscopy Keji Lai, University of Texas at Austin |
| 11:40am | SP+AS+NS+SS-WeM12 Subsurface Visualization of Soft Matrix using 3D-Spectroscopic Atomic Force Acoustic Microscopy Kuniko Kimura, K. Kobayashi, A. Yao, H. Yamada, Kyoto University, Japan |
| 12:00pm | SP+AS+NS+SS-WeM13 Quantifying the Effects of Cantilever Modes Shapes on Studies of the Liquid-Solid Interface Aleks Labuda, M. Viani, D. Walters, R. Proksch, Asylum Research, an Oxford Instruments company |