| AVS 62nd International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
| Session SP+AS+NS+SS-WeM |
| Session: | Advances in Scanning Probe Microscopy |
| Presenter: | Ruslan Temirov, Forschungszentrum Juelich GmbH, Germany |
| Authors: | R.T. Temirov, Forschungszentrum Juelich GmbH, Germany C.W. Wagner, Forschungszentrum Juelich GmbH, Germany M.F.B.G. Green, Forschungszentrum Juelich GmbH, Germany P.L. Leinen, Forschungszentrum Juelich GmbH, Germany T.D. Deilmann, Muenster University, Germany P. Krueger, Muenster University, Germany M.R. Rohlfing, Muenster University, Germany F.S.T. Tautz, Forschungszentrum Juelich GmbH, Germany |
| Correspondent: | Click to Email |
Interactions between atomic and molecular objects are to a large extent defined by the nanoscale electrostatic
potentials which these objects produce. Consequently, a tool for nanometre scale imaging and quantification of
local electrostatic fields could help in many areas of nanoscience research. In this contribution we introduce a
scanning probe technique that for the first time enables truly three-dimensional imaging of local electrostatic
potential fields with sub-nanometre resolution. Registering single electron charging events of a molecular
quantum dot attached to the tip of a tuning fork atomic force microscope operated at 5 K, we image the
quadrupole field of a single molecule adsorbed on a metal surface. To demonstrate quantitative measurements,
we investigate the Smoluchowski dipole field created by a single metal adatom adsorbed on a metal surface. We
show that because of its high sensitivity the technique can probe electrostatic potentials at large distances from
their sources, which should allow for the imaging of samples with increased surface roughness.
Reference
[1] C. Wagner, M. F. B. Green, P. Leinen, T. Deilmann, P. Krüger, M. Rohlfing, R. Temirov, F. S. Tautz
arXiv:1503.07738 (2015)