| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:40am | AS+NS-TuM3 Invited Paper ASSD 30th Anniversary Speaker: Defect Detection and Characterization in Wafer Processing and Magnetic Storage Technologies – Then, Now and (maybe) the Future. Christopher Brundle, C R Brundle and Asociates |
| 9:20am | AS+NS-TuM5 Characterisation of Glass-To-Metal Interfaces using FIB and STEM Paul Yates, University of Surrey, UK |
| 9:40am | AS+NS-TuM6 X-ray Structural Analysis of Self-assembled Nano-Dielectrics Li Zeng, A. Walker, Northwestern University, R. Turrisi, University of Milano-Bicocca, Italy, M.C. Hersam, T.J. Marks, M.J. Bedzyk, Northwestern University |
| 11:00am | AS+NS-TuM10 Invited Paper Multimodal Imaging for Physical and Chemical Surface Characterization using a Combined Atomic Force Microscopy-Mass Spectrometry Platform Olga Ovchinnikova, Oak Ridge National Laboratory |
| 11:40am | AS+NS-TuM12 Understanding the TERS Effect with On-line Tunneling and Force Feedback Using Multiprobe AFM/NSOM with Raman Integration A. Lewis, The Hebrew University of Jerusalem and Nanonics Imaging Ltd, Israel, Rimma Dekhter, P. Hamra, Y. Bar-David, H. Taha, Nanonics Imaging Ltd, Jerusalem, Israel |
| 12:00pm | AS+NS-TuM13 High Resolution CREM for Electrical Characterization of Thin Oxide Layers Hagai Cohen, A. Givon, Weizmann Institute of Science, Israel |