| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS+NS-TuM |
| Session: | Chemical/Molecular Information from Sub-micron Features and Materials |
| Presenter: | Olga Ovchinnikova, Oak Ridge National Laboratory |
| Correspondent: | Click to Email |
The functionality of materials is largely determined by the mechanisms that take place at sub-micron length scales and at interfaces. In order to understand these complex material systems and further improve them, it is necessary to measure and map variations in properties and functionality at the relevant physical, chemical, and temporal length scales. The goal of multimodal imaging is to transcend the existing analytical capabilities for nanometer scale spatially resolved material characterization at interfaces through a unique merger of advanced scanning probe microscopy, mass spectrometry and optical spectroscopy. Combining atomic force microscopy (AFM) and mass spectrometry (MS) onto one platform has been demonstrated by our group as a method for high resolution spot sampling and imaging of substrates. To advance this basic approach and to expand its capabilities we now have incorporated Band-Excitation (BE) to allow us to measure nanomechanical properties of a sample by measuring the contact resonance frequency shift. In this presentation, I will discuss the benefits of a multimodal imaging system and demonstrate our results for polymeric systems, biological plant and animal tissue, and bacterial colonies. I will also talk about future developments to incorporate spectroscopic measurements into the platform.
This work was supported by the Division of Chemical Sciences, Geosciences, and Biosciences, Office of Basic Energy Sciences, United States Department of Energy. ORNL is managed by UT-Battelle, LLC for the U.S. Department of Energy under contract DE-AC05-00OR22725.