| AVS 61st International Symposium & Exhibition | |
| Helium Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| HI-ThP1 Fabrication of Single Atom Tip and Characteristics of Gas Field Ion Source at Room Temperature In-Yong Park, B. Cho, C. Han, J. Kim, N.-K. Chung, S.J. Ahn, KRISS, Korea |
| HI-ThP2 Probing Structural Aspects of <10 nm-sized Young Soot M. Schenk, University of Bielefeld, Germany, S. Lieb, University of Southern California, H. Vieker, A. Beyer, Armin Gölzhäuser, University of Bielefeld, Germany, H. Wang, University of Southern California, K. Kohse-Höinghaus, University of Bielefeld, Germany |
| HI-ThP3 Fabrication of Carbon Nanotube Nanogap Electrodes by Helium Ion Sputtering for Molecular Contacts C. Thiele, Karlsruhe Institute of Technology, Germany, H. Vieker, André Beyer, Bielefeld University, Germany, B.S. Flavel, F. Hennrich, Karlsruhe Institute of Technology, Germany, D.M. Torres, T.R. Eaton, University of Basel, Switzerland, M. Mayor, M.M. Kappes, Karlsruhe Institute of Technology, Germany, A. Gölzhäuser, Bielefeld University, Germany, H.V. Löhneysen, R. Krupke, Karlsruhe Institute of Technology, Germany |
| HI-ThP4 High Resolution UHV Helium Ion Microscopy of Work Function, Step Edges and Crystal Structure Gregor Hlawacek, Helmholtz-Zentrum Dresden - Rossendorf, Germany, M. Jankowski, R. van Gastel, H. Wormeester, H.J.W. Zandvliet, B. Poelsema, University of Twente, Netherlands |
| HI-ThP6 Ion Beam Analysis in a Helium Ion Microscope Nico Klingner, R. Heller, G. Hlawacek, S. Facsko, J. von Borany, Helmholtz-Zentrum Dresden - Rossendorf, Germany |