| AVS 61st International Symposium & Exhibition | |
| Helium Ion Microscopy Focus Topic | Thursday Sessions |
| Session HI-ThP |
| Session: | Aspects of Helium Ion Microscopy Poster Session |
| Presenter: | André Beyer, Bielefeld University, Germany |
| Authors: | C. Thiele, Karlsruhe Institute of Technology, Germany H. Vieker, Bielefeld University, Germany A. Beyer, Bielefeld University, Germany B.S. Flavel, Karlsruhe Institute of Technology, Germany F. Hennrich, Karlsruhe Institute of Technology, Germany D.M. Torres, University of Basel, Switzerland T.R. Eaton, University of Basel, Switzerland M. Mayor, Karlsruhe Institute of Technology, Germany M.M. Kappes, Karlsruhe Institute of Technology, Germany A. Gölzhäuser, Bielefeld University, Germany H.V. Löhneysen, Karlsruhe Institute of Technology, Germany R. Krupke, Karlsruhe Institute of Technology, Germany |
| Correspondent: | Click to Email |
We use helium ion beam lithography to sputter nanogaps of 2.8 ± 0.6 nm size into single metallic carbon nanotubes embedded in a device geometry (1). The high reproducibility of the gap size formation provides a reliable nanogap electrode testbed for contacting small organic molecules. To demonstrate the functionality of these nanogap electrodes, we integrate oligo(phenylene ethynylene) molecular rods, and measure resistance before and after gap formation and with and without contacted molecules.
(1) C. Thiele, H. Vieker, A. Beyer, B.S. Flavel, F, Hennrich, D.M. Torres, T.R. Eaton, M. Mayor, M.M. Kappes, A. Gölzhäuser, H.v. Löhneysen, R. Krupke: Fabrication of carbon nanotube nanogap electrodes by helium ion sputtering for molecular contacts, Appl. Phys. Lett., doi: 10.1063/1.4868097 (2014)