AVS 61st International Symposium & Exhibition
    Helium Ion Microscopy Focus Topic Thursday Sessions
       Session HI-ThP

Paper HI-ThP4
High Resolution UHV Helium Ion Microscopy of Work Function, Step Edges and Crystal Structure

Thursday, November 13, 2014, 6:00 pm, Room Hall D

Session: Aspects of Helium Ion Microscopy Poster Session
Presenter: Gregor Hlawacek, Helmholtz-Zentrum Dresden - Rossendorf, Germany
Authors: G. Hlawacek, Helmholtz-Zentrum Dresden - Rossendorf, Germany
M. Jankowski, University of Twente, Netherlands
R. van Gastel, University of Twente, Netherlands
H. Wormeester, University of Twente, Netherlands
H.J.W. Zandvliet, University of Twente, Netherlands
B. Poelsema, University of Twente, Netherlands
Correspondent: Click to Email
Helium Ion Microscopy---in particular under UHV conditions---is well know for it's high resolution imaging capabilities and the exceptional surface sensitivity. Here, we utilize both of these outstanding characteristics of this technology to visualize step edges, minute changes in composition and structural properties of a Ag/Pt alloy layer grown on Pt(111). A work function contrast of only a few ten's of meV allows to distinguish between areas of different Ag content in the alloy layer. As a result step edges on the Pt(111) crystal overgrown by the alloy layer become visible. Furthermore, the regular arrangement of FCC and HCP areas in the alloy layer could be revealed using fast Fourier image analysis and dechanneling image contrast. The measured spacing of 6 nm agrees well with the expected value. Low energy electron microscopy has been used to cross check the results and further analyze the alloy layer.

This research is supported by the Dutch Technology Foundation STW, which is the applied science division of NWO, and the Technology Programme of the Ministry of Economic Affairs.