AVS 60th International Symposium and Exhibition
    Synchrotron Analysis Focus Topic Wednesday Sessions
       Session SA+AS+MI+SS-WeM

Paper SA+AS+MI+SS-WeM4
Recent Advances in High Resolution Real and Reciprocal Space Photoelectron Emission Microscopy

Wednesday, October 30, 2013, 9:00 am, Room 203 C

Session: Synchrotron and Imagery: PEEM, Nano-ARPES and Others (8:00-9:40 am)/Synchrotron TXRF and Related Techniques (10:40 am-12:00 pm)
Presenter: K. Winkler, Omicron NanoScience, Germany
Authors: K. Winkler, Omicron NanoScience, Germany
B. Kroemker, Omicron NanoScience, Germany
N.J. Weber, FOCUS GmbH, Germany
M. Escher, FOCUS GmbH, Germany
N. Barrett, Cea Dsm Iramis Spcsi, France
Correspondent: Click to Email
Conventional electron spectroscopy methods are limited in providing simultaneous real and reciprocal or k-space information from small areas under laboratory conditions. Therefore, the characterization of materials with only micron scale sample homogeneity requires new instrumentation. Recent improvements in aberration compensated energy-filtered photoelectron emission microscopy (PEEM) can overcome the known limitations in both synchrotron and laboratory environments.

We present first results from real and reciprocal space photoelectron emission microscopy (PEEM) e.g. on Ag (111) showing high k and high energy resolution using a laboratory based He I and II radiation at room temperature and temperatures below 40K. The combination of a recently developed LHe cooled sample stage with an improved aberration compensated energy-filter allows 30 meV energy resolution while a new type of event counting detector improves the signal to noise ratio of the detector.