AVS 60th International Symposium and Exhibition
    Synchrotron Analysis Focus Topic Wednesday Sessions
       Session SA+AS+MI+SS-WeM

Paper SA+AS+MI+SS-WeM6
Nano-ARPES Beamline at SOLEIL: A Powerful and Innovative Probe for Nanoscience

Wednesday, October 30, 2013, 9:40 am, Room 203 C

Session: Synchrotron and Imagery: PEEM, Nano-ARPES and Others (8:00-9:40 am)/Synchrotron TXRF and Related Techniques (10:40 am-12:00 pm)
Presenter: M.C. Asensio, Synchrotron SOLEIL, France
Correspondent: Click to Email

Over the last decades, we have witnessed exponential advances in a wide diversity of new nanotechnologies. These advances, seen particularly in nanoelectronics, nanomagnetism and nanochemistry, among others, affect almost every aspect of our lives. Following the fundamental step in the creation of nano-objects and even if these "building blocks" have shown remarkable properties, they would have remained unexploited if, at the same time, we had not developed new tools capable of analyzing, viewing and scrutinizing objects on a wide range of scales, from a few microns to a few tens of nanometers.

Recently, great progress has been made as a result of the rapid expansion in the range of modern microscopies. However, if they have achieved nanometer spatial resolution, the challenge still remains to provide powerful high-energy-resolution spectroscopic tools for probing nano- and micro-areas. The challenge then, is to quantify and analyze the electronic properties of advanced materials on a nano- and mesoscopic-scale. For such a result, analysis of the electronic structure must be comprehensive, not only with regard to detection of core levels, but especially to study the structure of electronic states of the valence bands, directly responsible for chemical bonds, electrical transport and the thermal and mechanical properties.

In this presentation, the latest results of the ANTARES microscope beamline at the synchrotron SOLEIL will be disclosed. In particular, nano-ARPES findings describing the electronic band structure of mono-atomic thick graphene films grown on copper substrates by chemical vapor deposition will be presented1. This end-station, with a spatial resolution of several tens of nanometers, has already been able to carry out direct imaging of core levels, their chemical shifts and the band electronic structures of several ordered materials. High precise Chemical images and valence band information of nano-objects like exfoliated grapheme, granular materials and Nanowires will be reported.

1.- J. Avila et al., Sci. Rep. 2013, 14, August 3 : 2439 | DOI: 10.1038/srep02439