| AVS 59th Annual International Symposium and Exhibition | |
| Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | SP+AS+BI+ET+MI+TF-WeA1 Invited Paper Electrochemical Strain Microscopy: Nanoscale Imaging of Solid State Ionics S. Jesse, Oak Ridge National Laboratory |
| 2:40pm | SP+AS+BI+ET+MI+TF-WeA3 Probing Electrochemical Phenomena in Reactive Environments at High Temperature: In Situ Characterization of Interfaces in Fuel Cells S.S. Nonnenmann, R. Kungas, J.M. Vohs, D.A. Bonnell, University of Pennsylvania |
| 3:00pm | SP+AS+BI+ET+MI+TF-WeA4 High-Resolution Scanning Local Capacitance Measurements M. Brukman, University of Pennsylvania, S. Nanayakkara, National Renewable Energy Laboratory, D.A. Bonnell, University of Pennsylvania |
| 4:00pm | SP+AS+BI+ET+MI+TF-WeA7 Experimental Calibration of the Higher Flexural Modes of Microcantilever Sensors J.D. Parkin, G. Hähner, University of St Andrews, UK |
| 4:20pm | SP+AS+BI+ET+MI+TF-WeA8 Atomic Imaging with Peak Force Tapping B. Pittenger, Y. Hu, C. Su, S.C. Minne, Bruker AFM, I. Armstrong, Bruker Nano Surfaces Division |
| 4:40pm | SP+AS+BI+ET+MI+TF-WeA9 Invited Paper Nanoscale Chemical Composition Mapping with AFM-based Infrared Spectroscopy C.B. Prater, M. Lo, Q. Hu, Anasys Instruments, C. Marcott, Light Light Solutions, B. Chase, University of Delaware, R. Shetty, K. Kjoller, E. Dillon, Anasys Instruments |
| 5:20pm | SP+AS+BI+ET+MI+TF-WeA11 Quantifying Nanomechanical Properties with Simultaneous AM-FM and tanδ Imaging T. Mehr, A. Moshar, R. Proksch, I. Revenko, N. Geisse, S. Hohlbauch, D. Walters, J. Cleveland, J. Bemis, C. Callahan, D. Beck, Asylum Research |
| 5:40pm | SP+AS+BI+ET+MI+TF-WeA12 Simultaneous Scanning Tunneling and Atomic Force Microscopy with Subatomic Spatial Resolution FJ. Giessibl, University of Regensburg, Germany |