| AVS 59th Annual International Symposium and Exhibition | |
| Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
| Session SP+AS+BI+ET+MI+TF-WeA |
| Session: | Emerging Instrument Formats |
| Presenter: | A. Moshar, Asylum Research |
| Authors: | T. Mehr, Asylum Research A. Moshar, Asylum Research R. Proksch, Asylum Research I. Revenko, Asylum Research N. Geisse, Asylum Research S. Hohlbauch, Asylum Research D. Walters, Asylum Research J. Cleveland, Asylum Research J. Bemis, Asylum Research C. Callahan, Asylum Research D. Beck, Asylum Research |
| Correspondent: | Click to Email |
Frequency-Modulated (FM) is a powerful, quantitative technique for mapping interaction forces between an oscillating tip and sample. Since FM-AFM typically requires the use of three feedback loops, one ongoing challenge has been stable and cross-talk free operation. Amplitude-modulated Atomic Force Microscopy (AM-AFM), also known as tapping mode, is a proven, reliable and gentle imaging method with wide spread applications. Recently, the phase signal of the first resonant mode has been recast in terms of the tip-sample loss tangent.[1] This allows quantitative imaging of a response term that includes both the dissipated and stored energy of the tip sample interaction. Combining AM and FM imaging allows reaping the benefits of both techniques.[2] Because the feedback loops are decoupled, operation is more robust and simple than conventional FM imaging. In this mode, the topographic feedback is based on the AM signal of the first cantilever resonance while the second resonance drive is frequency modulated. The FM image returns a quantitative value of the frequency shift that in turn depends on the sample stiffness and can be applied to a variety of physical models. We will present results on a wide variety of materials as well as discussing quantitative separation of the elastic and dissipative components of the tip-sample interactions.[3]
References
[1] R. Proksch and D. Yablon, Appl. Phys. Lett. 100, 073106 (2012) and R. Proksch, D. Yablon, and A. Tsou, ACS Rubber Division 180th Technical Meeting, 2011-24 (2011).
[2] G. Chawla and S. Solares, Appl. Phys. Lett., 99, 074103 (2011) and R. Proksch and R. C. Callahan, US Patents 8,024,963 and 7,603,891.
[3] R. Proksch and S. V. Kalinin, Nanotechnology 21, 455705/1 (2010).