AVS 59th Annual International Symposium and Exhibition, Session IS+AS+OX+ET-WeM

AVS 59th Annual International Symposium and Exhibition
In Situ Microscopy and Spectroscopy Focus Topic	Wednesday Sessions

Session IS+AS+OX+ET-WeM
In Situ Characterization of Solids: Film Growth, Defects, and Interfaces

Wednesday, October 31, 2012, 8:00 am, Room 007
Moderator: P.W. Sutter, Brookhaven National Laboratory

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:00am	IS+AS+OX+ET-WeM1 Revealing Gas-Surface Radical Reaction Mechanisms of Self-Assembled Monolayers by Scanning Tunneling Microscopy D.Y. Lee, M.M. Jobbins, S.A. Kandel, University of Notre Dame
8:20am	IS+AS+OX+ET-WeM2 In Situ Imaging of the Nucleation and Growth of Epitaxial Anatase TiO₂(001) Films on SrTiO₃(001) Y.G. Du, D.J. Kim, T.C. Kaspar, Pacific Northwest National Laboratory, S.E. Chamberlin, University of Wisconsin Milwaukee, I. Lyubinetsky, S.A. Chambers, Pacific Northwest National Laboratory
8:40am	IS+AS+OX+ET-WeM3 Invited Paper In Situ Synchrotron X-Ray Studies of Epitaxial Oxide Thin Film Synthesis Behavior J.A. Eastman, M.J. Highland, P.H. Fuoss, Argonne National Laboratory, T.M. McCleskey, Los Alamos National Laboratory, D.D. Fong, C.M. Folkman, S.K. Keun, E. Perret, P.M. Baldo, Argonne National Laboratory, E. Bauer, Q. Jia, Los Alamos National Laboratory
9:40am	IS+AS+OX+ET-WeM6 Understanding the Dynamic Electronic Properties of Electrode Materials by In Situ X-ray Absorption Spectroscopy M. Bagge-Hansen, J.R.I. Lee, A. Wittstock, M.D. Merrill, M.A. Worsley, T. Ogitsu, B.C. Wood, T. Baumann, M. Stadermann, M. Biener, J. Biener, T. van Buuren, Lawrence Livermore National Laboratory
10:40am	IS+AS+OX+ET-WeM9 In Situ Studies of Al₂O₃ ALD Growth and Self-cleaning on III-V Surfaces by STM and XPS L.N.J. Rodriguez, A. De Clercq, IMEC, Belgium, M. Tallarida, BTU Cottbus, Germany, D. Cuypers, IMEC, Belgium, J.P. Locquet, KU Leuven, Belgium, S. Van Elshocht, C. Adelmann, M. Caymax, IMEC, Belgium
11:00am	IS+AS+OX+ET-WeM10 In Situ Transport Measurement of Kinetically Controlled Bi Atomic Layers Y. Fujikawa, E. Saitoh, Tohoku University, Japan
11:20am	IS+AS+OX+ET-WeM11 CAMECA IMS Series Advanced Ion Microscopy: High Throughput, Repeatability & Automation P. Peres, F. Desse, F. HIllion, M. Schuhmacher, Cameca, S.a., France, A.N. Davis, CAMECA Instruments, Inc.