| AVS 59th Annual International Symposium and Exhibition | |
| Helium Ion Microscopy Focus Topic | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | HI+AS+NS-WeA1 Invited Paper Basics of Imaging with Ions D. Joy, University of Tennessee |
| 2:40pm | HI+AS+NS-WeA3 Invited Paper Surface Analysis using Channeling Contrast in NUHV Helium Ion Microscopy B. Poelsema, University of Twente, Netherlands |
| 4:00pm | HI+AS+NS-WeA7 Evaluation of W(111) Gas Field Ion Sources Based on Single Atom Tips R. Urban, University of Alberta and The National Institute for Nanotechnology, Canada, J.L. Pitters, National Institute for Nanotechnology, NRC Canada, R.A. Wolkow, University of Alberta and The National Institute for Nanotechnology, Canada |
| 4:20pm | HI+AS+NS-WeA8 Single-atom Tip as an Emitter of Gas Field Ion Sources I.-S. Hwang, H.-S. Kuo, Academia Sinica, Taiwan, Republic of China, T.-Y. Fu, National Taiwan Normal University, Taiwan, Republic of China, J.-L. Hou, C.-Y. Lin, Y.-H. Lu, W.-T. Chang, T.T. Tsong, Academia Sinica, Taiwan, Republic of China |
| 4:40pm | HI+AS+NS-WeA9 Helium Ions for Imaging and Nanofabrication on the nm Scale E. Van Veldhoven, H.H.P.Th. Bekman, F.T. Molkenboer, N.B. Koster, D.J. Maas, TNO Technical Sciences, The Netherlands |
| 5:00pm | HI+AS+NS-WeA10 Towards Secondary Ion Mass Spectrometry on the Helium Ion Microscope T. Wirtz, N. Vanhove, L. Pillatsch, D. Dowsett, Centre de Recherche Public – Gabriel Lippmann, Luxembourg, S. Sijbrandij, J. Notte, Carl Zeiss |