| AVS 59th Annual International Symposium and Exhibition | |
| Helium Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:40am | HI+AS+BI+NS-ThM3 Invited Paper Helium Ion Microscopy of Photonic Structures in Biological Systems S.A. Boden, A. Asadollahbaik, H.N. Rutt, D.M. Bagnall, University of Southampton, UK |
| 9:20am | HI+AS+BI+NS-ThM5 Imaging of Carbon Nanomembranes (CNM) and Graphene with Helium Ion Microscopy H. Vieker, A. Beyer, A. Polina, A. Willunat, N.-E. Weber, M. Büenfeld, A. Winter, X. Zhang, M. Ai, A. Turchanin, A. Gölzhäuser, Bielefeld University, Germany |
| 10:40am | HI+AS+BI+NS-ThM9 Invited Paper Dopant Contrast in Helium Ion Microscopy Y. Chen, H. Zhang, D. Fox, C.C. Faulkner, J. Wang, J. Boland, J. Donegan, Trinity College, Ireland |
| 11:20am | HI+AS+BI+NS-ThM11 High Resolution Patterning of Carbon Nanomembranes and Graphene via Extreme UV Interference Lithography: A Helium Ion Microscopy Study A. Winter, A. Willunat, A. Beyer, University of Bielefeld, Germany, Y. Ekinci, Paul Scherrer Institute, Switzerland, A. Gölzhäuser, A. Turchanin, University of Bielefeld, Germany |
| 11:40am | HI+AS+BI+NS-ThM12 Application of Helium Ion Microscope on Processing and Characterization of Nano Wires H.X. Guo, S. Nagano, K. Onishi, D. Fujita, National Institute for Materials Science (NIMS), Japan |