| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-WeM1 Invited Paper Fibril Formation within the Extracellular Matrix, from Preventing Bacterial Infections to Artificial Tissue Generation P. Koelsch, University of Washington |
| 8:40am | AS-WeM3 In Situ Monitoring of SDS Adsorption on Positively Charged Surfaces S.-H. Song, P. Koelsch, T. Weidner, University of Washington, M.S. Wagner, The Procter & Gamble Company, D.G. Castner, University of Washington |
| 9:00am | AS-WeM4 Invited Paper Enhanced Infrared Spectroscopy and Near-Field Microscopy with Infrared Antennas T. Taubner, RWTH Aachen University, Germany |
| 9:40am | AS-WeM6 FT-IR Spectrochemical Imaging: Applications with Focal Plane Array and Multiple Beam Synchrotron Radiation Source M. Unger, E. Mattson, J. Sedlmaier, Z. Alavi, R. Dsouza, B. Manandar, C. Hirschmugl, University of Wisconsin Milwaukee |
| 10:40am | AS-WeM9 Invited Paper 3D Analysis using X-ray Computed Tomography S.R. Stock, Northwestern University |
| 11:20am | AS-WeM11 High Spatial Resolution 2D and 3D TOF-SIMS Analysis using Cluster Ion Beams F. Kollmer, S. Kayser, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA, Inc., D. Rading, R. Moellers, W. Paul, E. Niehuis, ION-TOF GmbH, Germany |
| 11:40am | AS-WeM12 An Evolution of TOF-SIMS for Biological Analysis: From 2D Imaging to 3D FIB-TOF Tomography G.L. Fisher, J.S. Hammond, S.R. Bryan, Physical Electronics |