| 2:00pm |
AS-MoA1
Polyatomic and Gas Cluster Ion Beam Depth-Profiling: A Model Indicating the Most Appropriate Source for an Arbitrary, Known Polymer Matrix and Estimates of Polymer Sputter Rates
P.J. Cumpson, N. Sano, NEXUS XPS Facility, Newcastle University, UK |
| 2:20pm |
AS-MoA2
XPS Profiling of Biosensor Materials with Argon Cluster Ions
P. Mack, R.G. White, T.S. Nunney, Thermo Fisher Scientific, UK, J.J. Pireaux, P. Louette, N. Wehbe, L. Houssiau, FUNDP, Namur, Belgium |
| 2:40pm |
AS-MoA3
ToF-SIMS and NanoSIMS Imaging of Uranium Distributions in the Sediment of Hanford Site
Z. Zhu, Z. Wang, Pacific Northwest National Laboratory |
| 3:00pm |
AS-MoA4
ToF-SIMS MCsx+ Dual Beam Depth Profiling with Improved Dynamic Range
S. Kayser, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA, Inc., F. Kollmer, R. Moellers, E. Niehuis, ION-TOF GmbH, Germany |
| 3:40pm |
AS-MoA6 Invited Paper
Surface Diffusion of Carbon on Metals and Complications for Auger Spectroscopy of Carburized Steels
W.D. Jennings, Case Western Reserve University |
| 4:20pm |
AS-MoA8
Charge Referencing Complex Organic Materials in XPS using Hexatriacontane
L. Lohstreter, Medtronic, Inc. |
| 4:40pm |
AS-MoA9
PADI: Ambient Surface Analysis of Polymers and Molecules – Metrology Development for Reliable Analysis
T.L. Salter, I.S. Gilmore, National Physical Laboratory, UK |
| 5:00pm |
AS-MoA10
Ion Beam Analysis of Surfaces and Thin Films
L.S. Wielunski, R.A. Bartynski, Rutgers University |