| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Monday Sessions |
| Session AS-MoA |
| Session: | Quantitative Surface Chemical Analysis, Technique Development, and Data Interpretation - Part 2 |
| Presenter: | P. Mack, Thermo Fisher Scientific, UK |
| Authors: | P. Mack, Thermo Fisher Scientific, UK R.G. White, Thermo Fisher Scientific, UK T.S. Nunney, Thermo Fisher Scientific, UK J.J. Pireaux, FUNDP, Namur, Belgium P. Louette, FUNDP, Namur, Belgium N. Wehbe, FUNDP, Namur, Belgium L. Houssiau, FUNDP, Namur, Belgium |
| Correspondent: | Click to Email |
Sensors for biological compounds are becoming increasingly important in a wide variety of applications. These devices are typically composed of complex stacks of thin/ultrathin layers of biochemical compounds. The overall behaviour of the sensor is strongly influenced by the elemental and chemical properties of the individual layers, but the interactions at layer interfaces may also have an effect.
There is an increasing requirement for compositional profiling of these devices, combining the chemical selectivity and surface specificity of XPS with some kind of ion beam sputtering. Traditional methods such as argon monomer ion profiling can result in a high degree of chemical modification during the acquisition of depth profiles for organic materials. Over the last few years, there have been numerous studies and investigations into the use of argon cluster beams for depth profiling with the goal of preserving chemical information during analysis of organic materials.
This talk will present data from cluster profiling studies of amino acid based biosensors. The chemical variation between amino acid layers is very subtle, but it will be demonstrated that the combination of rapid acquisition XPS and argon cluster profiling is able to characterise the changes in chemistry throughout the layer stack.