| AVS 59th Annual International Symposium and Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS+BI-TuM1 Invited Paper Clinical Application of Surface Analysis Technologies – Needs, Requirements and Challenges J. Schnekenburger, Muenster University, Germany |
| 8:40am | AS+BI-TuM3 The Application of XPS to the Study of Protein Lyophilizates S.J. Coultas, J.D.P. Counsell, A.J. Roberts, S.J. Hutton, C.J. Blomfield, Kratos Analytical Ltd, UK, R. Geidobler, G. Winter, Ludwig-Maximilians-University, Germany |
| 9:00am | AS+BI-TuM4 Characterization of Real-World Surfaces and Interfaces of Devices in the Biomedical Industry W. Theilacker, A. Belu, L. Lohstreter, L. LaGoo, Corporate Technology and Innovation, Medtronic, Inc. |
| 9:20am | AS+BI-TuM5 Ageing Processes Occurring on Nanoscaled Aminated Surfaces as Observed by ToF-SIMS/PCA, NEXAFS Spectroscopy and XPS W.E.S. Unger, BAM Federal Inst. for Materials Res. and Testing, Germany, H. Min, BAM Federal Inst. for Materials Res. and Testing and KAIST Korea, S. Swaraj, BAM Federal Inst. for Materials Res. and Testing and Soleil Synchrotron France, P.-L. Girard-Lauriault, BAM Federal Inst. for Materials Res. and Testing and McGill Univ. Toronto, A. Lippitz, BAM Federal Inst. for Materials Res. and Testing, Germany |
| 9:40am | AS+BI-TuM6 Signature Discovery in Explosives and Bioagents using Imaging Mass Spectrometry C.M. Mahoney, Pacific Northwest National Laboratory |
| 10:40am | AS+BI-TuM9 Topography and Field Effects in the Inner Side of Micro via Hole using ToF-SIMS J.C. Lee, Y.K. Kyoung, I.Y. Song, Samsung Advanced Institute of Technology, Republic of Korea, S. Iida, Ulvac Phi, Japan |
| 11:00am | AS+BI-TuM10 Using XPS to Probe the Surface Chemistry of Ionic Liquids J.D.P. Counsell, S.J. Coultas, A.J. Roberts, S.J. Hutton, C.J. Blomfield, Kratos Analytical Ltd., UK |
| 11:20am | AS+BI-TuM11 XPS Profiling and Work Function Mapping of a Damaged Solar Cell B. Strohmeier, Thermo Fisher Scientific, P. Mack, T.S. Nunney, J. Wolstenholme, Thermo Fisher Scientific, UK |
| 11:40am | AS+BI-TuM12 Application of XPS Imaging Analysis in Understanding of Interfacial Delamination and Related Problems H. Piao, General Electric Global Research Center, N. Fairley, Casa Software Ltd, UK, J. Walton, The University of Manchester, UK |