| AVS 58th Annual International Symposium and Exhibition | |
| Applied Surface Science Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-TuP2 An Electrostatic Analytical Microscope for SEM/SAM Surface Studies with 3nm-7nm Spatial Resolution Andrew Walker, M. Rignall, Shimadzu Research Laboratory (Europe) Ltd., UK |
| AS-TuP3 Core Level Shift from Experiment and First-Principles-Theory – A Comparison Boris Kiefer, New Mexico State University, B. Halevi, K. Artyushkova, University of New Mexico |
| AS-TuP4 Evaluation of C60 Depth Profiling Conditions for XPS Organic Films Analysis Saad Alnabulsi, S.R. Bryan, J. Moulder, Physical Electronics |
| AS-TuP5 Development and Application of Novel Electron Energy Analyzers for Chemical Analysis of Surfaces Dane Cubric, Shimadzu Research Laboratory (Europe) Ltd., UK, N. Kholine, Institute for Analytical Instrumentation, RAS, Russian Federation |
| AS-TuP6 Extreme Brightness: Reaching the Ultimate Limits of the Electron Beam Jonathan Jarvis, J.L. Kohler, B. Ivanov, N. De Jonge, B.K. Choi, A.B. Hmelo, C.A. Brau, Vanderbilt University |
| AS-TuP8 Surface Characterization of Disposable Laboratory Gloves by X-ray Photoelectron Spectroscopy (XPS) B.R. Strohmeier, Christopher Baily, T.S. Nunney, Thermo Fisher Scientific, UK, A. Plasencia, Thermo Fisher Scientific, J.D. Piasecki, RJ Lee Group, Inc. |
| AS-TuP10 Large Area Cross Sectional Microstructural Characterization of ToF-SIMS Depth Profile Crater Walls Vincent S. Smentkowski, D. Ellis, GE-GRC |
| AS-TuP11 Microphase Separation of Various Diblock Copolymers Investigated by TOF-SIMS Depth Profiling Yeonhee Lee, Korea Institute of Science and Technology, Republic of Korea, J. Lee, Korea University, W.C. Lim, Korea Institute of Science and Technology, K. Shin, Sogang University, Korea, K.-J. Kim, Korea University |
| AS-TuP12 Analysis of Passivated Surfaces for Mass Spectrometer Inlet Systems by Auger Electron and X-Ray Photoelectron Spectroscopy Henry Ajo, D.W. Blankenship, E.A. Clark, Savannah River National Laboratory |
| AS-TuP13 Surface Characterization of Gunshot Residue (GSR) by X-ray Photoelectron Spectroscopy (XPS) and High Resolution Electron Microscopy A.J. Schwoeble, RJ Lee Group, Inc., Brian Strohmeier, Thermo Fisher Scientific, K.L. Bunker, D.R. McAllister, J.P. Marquis, Jr.,, J.D. Piasecki, N.M. McAllister, RJ Lee Group, Inc., W. Sgammato, Thermo Fisher Scientific |
| AS-TuP14 Analysis of Graphene and Other Graphitic Materials using XPS and AES Harry Meyer III, Oak Ridge National Laboratory |
| AS-TuP15 Investigation of Precious-Metal/Metal-Oxide-Support Interactions in Automotive Catalytic Converters using a Pd/ Ce0.7Zr0.3O2 Model Planar Catalyst System Obiefune Ezekoye, University of Michigan, M.I. Nandasiri, Western Michigan University, T. Varga, P. Nachimuthu, W. Jiang, S.V.N.T. Kuchibhatla, S. Thevuthasan, Pacific Northwest National Laboratory, X. Pan, G.W. Graham, University of Michigan |
| AS-TuP17 Cleaning and Characterization of InP Surface using Atomic Hydrogen and STM W. Melitz, J. Shen, Tyler Kent, University of California San Diego, R. Droopad, Texas State University, P.K. Hurley, Tyndall National Institute, A.C. Kummel, University of California San Diego |
| AS-TuP18 Highly Selective and Low Damage Etching of GaAs/ AlGaAs Heterostructure using Cl2/ O2 Neutral Beam JongSik Oh, K.S. Min, C.K. Kim, G.Y. Yeom, Sungkyunkwan University, Korea |
| AS-TuP19 TiO2 Nanotube Growth Mechanism Studied with Scanning Auger Spectroscopy Dennis Paul, Physical Electronics, S. Berger, F. Schmidt-Stein, S.P. Albu, H. Hildebrand, P. Schmuki, University of Erlangen-Nürnberg, Germany, J.S. Hammond, Physical Electronics |
| AS-TuP20 Effect of Annealing TiN/Al2O3 Nanofilms Grown on InGaAs Oscar Ceballos-Sanchez, A. Sanchez-Martinez, M.O. Vazquez-Lepe, CINVESTAV-Unidad Queretaro, Mexico, P. Lysaght, SEMATECH, A. Herrera-Gomez, CINVESTAV-Unidad Queretaro, Mexico |
| AS-TuP21 Comparison between the Continuous and Discrete Model to Assess the Thickness of SiO2 Layers on Si with XPS Data Milton Vazquez-Lepe, P.G. Mani-Gonzalez, A. Mendoza-Galvan, A. Herrera-Gomez, Cinvestav Queretaro Mexico |
| AS-TuP22 Electrical and Surface Studies of the High-k Gate Dielectrics Al2O3, HfO2, and AlxHfyOz on Silicon via Atomic Layer Deposition S. Hogan, G. Hernandez, R. Candler, S. Franz, YouSheng (Wilson) Lin, UCLA |
| AS-TuP23 Enhanced Green Emission from UV Down-Converting Ce3+- Tb3+ Co-Activated ZnAl2O4 Phosphor K.G. Tshabalala, University of the Free State, South Africa, S. Cho, J. Park, Korea Institute of Science and Technology, Republic of Korea, H.C. Swart, Odireleng Ntwaeaborwa, University of the Free State, South Africa |
| AS-TuP24 Characterization of AlxGa1-xN Thin Film Light Emitting Diode (LED) Device by Spectroscopic Ellipsometry K. Uppireddi, Li Yan, HORIBA Scientific |