| AVS 53rd International Symposium | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-WeM1 Invited Paper Recent Advancements in Polymeric Depth Profiling with an SF@sub 5@@super +@ Cluster Primary Ion Source C.M. Mahoney, National Institute of Standards and Technology |
| 8:40am | AS-WeM3 TOF-SIMS Analysis of C60 Sputtered Organic Thin Films S.R. Bryan, J. Moulder, G.L. Fisher, Physical Electronics, N. Sanada, ULVAC-PHI |
| 9:00am | AS-WeM4 XPS and QCM Studies of PMMA and Teflon AF1600 Films Bombarded by 1-20 keV C@sub 60@@super +@ Ions I.L. Bolotin, S.H. Tetzler, L. Hanley, University of Illinois at Chicago |
| 9:40am | AS-WeM6 Applications of a Bismuth-Cluster Ion Gun in Organic and Inorganic Surface Analysis F. Kollmer, R. Moellers, T. Grehl, D. Rading, E. Niehuis, ION-TOF GmbH, Germany |
| 10:40am | AS-WeM9 Invited Paper Utilization of Polymers in Ocular Science Applications R.M. Braun, Bausch & Lomb |
| 11:20am | AS-WeM11 Multi-Technique Characterization of a Drug Delivery System to Obtain 3-D Chemical Information A.M. Belu, Medtronic, Inc., C.M. Mahoney, National Institute of Standards and Technology, K. Wormuth, SurModics, Inc. |
| 11:40am | AS-WeM12 Combining Fluidics, Surface Chemistries and Direct Mass Spectrometric Detection to Address Protein Analyte Quantitation from Complex Samples for the Purpose of Diagnostic Assays L.O. Lomas, E. Fung, E. Boschetti, Ciphergen |
| 12:00pm | AS-WeM13 The Surface Characterisation of Arrayed Biomaterial Systems A.J. Urquhart, University of Nottingham, UK, D.G. Anderson, Massachusetts Institute of Technology, M.R. Alexander, University of Nottingham, UK, R. Langer, Massachusetts Institute of Technology, M.C. Davies, University of Nottingham, UK |