| AVS 52nd International Symposium | |
| Applied Surface Science | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-FrM1 ToF-SIMS Measurements of a Fluorocarbon-based Self-Assembled Monolayer on Si J.A. Ohlhausen, K.R. Zavadil, Sandia National Laboratories |
| 8:40am | AS-FrM2 XPS-imaging; Investigation of the Potentials of a Recent Algorithm Applied to a Patterned Polymer S. Hajati, S. Tougaard, University of Southern Denmark, S.J. Coultas, C.J. Blomfield, C. Moffitt, Kratos Analytical Ltd, UK |
| 9:00am | AS-FrM3 Invited Paper Surface Analysis in Modern Industry - More, Faster, Cheaper, Better? I.W. Fletcher, S.F. Davies, ICI plc, UK |
| 9:40am | AS-FrM5 Comparison of Methods for the Quantification and 3D Characterization of Polymer Blends using XPS and CLSM J.L. Fenton, K. Artyushkova, J.E. Fulghum, University of New Mexico |
| 10:00am | AS-FrM6 X-ray Photoelectron Spectroscopic Study of an Oxygen-doped Zinc Sulfide Surface Using Sample Biasing Y.-Q. Wang, P.M.A. Sherwood, Oklahoma State University |
| 10:20am | AS-FrM7 Thin Oxide Free Phosphate Films of Novel Composition formed on the Surface of Vanadium Metal and Characterized by X-Ray Photoelectron Spectroscopy D.J. Asunskis, P.M.A. Sherwood, Oklahoma State University |
| 10:40am | AS-FrM8 Surface Characterization of Metal Exchanged Mesoporous Materials S.G. MacKay, K.D. Bishop, B.K. Schaefer, J.D. Anderson, J.C. Bolton, H.H. Patterson, University of Maine |
| 11:20am | AS-FrM10 Improving High Resolution AFM Images - When are Sharp Tips Worthwhile? C.F.H. Gondran, ATDF Inc., a subsidiary of SEMATECH, D.K. Michelson, ISMI, a subsidiary of SEMATECH |
| 11:40am | AS-FrM11 Microscopy Study of Composites Based on Propylene-Ethylene Copolymers L.L. Ionescu-Vasii, P. Wood-Adams, Concordia University, Canada, E. Duschene, Ecole Polytechnique de Montréal, Canada |