AVS 51st International Symposium
    Applied Surface Science Wednesday Sessions
       Session AS-WeM

Paper AS-WeM2
Detection of Small Chemical Changes on Liquid Crystal-Aligning Polymer Surfaces using Multivariate Data Analysis of XPS Spectra

Wednesday, November 17, 2004, 8:40 am, Room 210A

Session: Chemometric Analysis of Spectral or Image Data; XPS/TOF-SIMS Applications
Presenter: S. Pylypenko, The University of New Mexico
Authors: S. Pylypenko, The University of New Mexico
K. Artyushkova, The University of New Mexico
J.E. Fulghum, The University of New Mexico
Correspondent: Click to Email

Ion beam alignment of liquid crystals is one of several non-contact methods under investigation as a substitute for mechanical rubbing. The characterization of Ar+ ion beam modified polymers is required in order to understand the macroscopic and microscopic alignment mechanisms. Polymer alignment layers, including polyimide and polystyrene, were studied using X-ray Photoelectron Spectroscopy (XPS) to characterize chemical changes and the surface anisotropy of the alignment substrate. XPS spectra were acquired from samples before and after bombardment, after exposure to the atmosphere, and after 90 degree rotations. XPS spectra of the polymers are dominated by changes resulting from Ar+ ion beam exposure, but also contain smaller changes related to chemical anisotropy. The effect of surface oxidation resulting from the high reactivity of the polymer surfaces after bombardment also must be taken into consideration when interpreting the spectra. We used multivariate analysis to differentiate between chemical changes from ion beam bombardment and oxidation versus the small changes due to chemical anisotropy created by the ion bombardment. Spectra manipulation, including subtraction, and multivariate analysis using Principal Component Analysis (PCA) and Multivariate Curve Resolution (MCR) allowed us to extract information about small changes due to chemical anisotropy. The anisotropy, and associated liquid crystal alignment, result from selective destruction of the weakest bonds relative to the direction of ion beam bombardment.