AVS 51st International Symposium | |
Applied Surface Science | Wednesday Sessions |
Session AS-WeM |
Session: | Chemometric Analysis of Spectral or Image Data; XPS/TOF-SIMS Applications |
Presenter: | G. Jiang, Brigham Young University |
Authors: | G. Jiang, Brigham Young University D. Stone, Brigham Young University L. Baxter, Brigham Young University B.J. Tyler, University of Utah M.R. Linford, Brigham Young University |
Correspondent: | Click to Email |