| AVS 51st International Symposium | |
| Applied Surface Science | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-FrM1 Elemental and Surface Analysis Via Focused Ion Beam Induced X-Rays L.A. Giannuzzi, FEI Company |
| 8:40am | AS-FrM2 Invited Paper FIB for Materials Characterization, Device Creation and Sample Preparation R.J. Young, FEI Company |
| 9:20am | AS-FrM4 High Spatial Resolution XPS Analysis of Focused Ion Beam Irradiated Specimens J.L. Fenton, K.M. Archuleta, J.E. Fulghum, The University of New Mexico, D.P. Adams, M.J. Vasile, Sandia National Laboratories |
| 10:20am | AS-FrM7 Examining the Impacts of Ion Sputtering on Nanoparticles and Nanoporous Materials A.S. Lea, M.H. Engelhard, D.J. Gaspar, J.R. Williams, D.R. Baer, Pacific Northwest National Laboratory |
| 10:40am | AS-FrM8 Determination of Optimum Depth-Resolution Conditions for Time-Of-Flight Medium Energy Backscattering R.D. Geil, B.R. Rogers, Z. Song, Vanderbilt University |
| 11:00am | AS-FrM9 Invited Paper Quantitative Profiling of Thin Films by Means of Elastic Recoil Detection Analysis (ERDA) with High Energetic Heavy Ions W. Bohne, J. Röhrich, E. Strub, Hahn Meitner Institut Berlin GmbH, Germany |