AVS 51st International Symposium | |
Applied Surface Science | Friday Sessions |
Session AS-FrM |
Session: | FIB and Novel Ion Analysis Methods |
Presenter: | W. Bohne, Hahn Meitner Institut Berlin GmbH, Germany |
Authors: | W. Bohne, Hahn Meitner Institut Berlin GmbH, Germany J. Röhrich, Hahn Meitner Institut Berlin GmbH, Germany E. Strub, Hahn Meitner Institut Berlin GmbH, Germany |
Correspondent: | Click to Email |