| AVS 49th International Symposium | |
| Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-ThA1 Transferring Classical UHV Techniques into Ambient Pressure - Is the Gap Bridged for Electrons? A. Vollmer, University of Cambridge, UK, J.D. Lipp, G.E. Derbyshire, Rutherford Appleton Laboratories, UK, H. Weiss, Universit@um a@t Magdeburg, Germany, D. Herein, ACA, Berlin, Germany, T. Rayment, University of Cambridge, UK |
| 2:20pm | AS-ThA2 Plan to Maximise Information Retrieval from the XPS Survey Scan J.E. Castle, The University of Surrey, UK |
| 2:40pm | AS-ThA3 Invited Paper Real World Surface Analysis W.R. Nieveen, T.F. Fister, P. Lindley, Charles Evans & Associates - Evans Analytical Group |
| 3:20pm | AS-ThA5 Invited Paper Nanoscale Tomography with the Focused Ion Beam R. Hull, University of Virginia |
| 4:00pm | AS-ThA7 Electromigration Behavior of Single Crystal Copper C.M. Contino, S.M. Schwarz, L.A. Giannuzzi, University of Central Florida |
| 4:20pm | AS-ThA8 XPS Analysis under External DC and AC Bias S. Suzer, B. Ulgut, Bilkent University, Turkey |