AVS 49th International Symposium
    Applied Surface Science Thursday Sessions
       Session AS-ThA

Paper AS-ThA7
Electromigration Behavior of Single Crystal Copper

Thursday, November 7, 2002, 4:00 pm, Room C-106

Session: Practical Surface Science II
Presenter: L.A. Giannuzzi, University of Central Florida
Authors: C.M. Contino, University of Central Florida
S.M. Schwarz, University of Central Florida
L.A. Giannuzzi, University of Central Florida
Correspondent: Click to Email
A preliminary report on the electromigration behavior of single crystal copper will be presented. A focused ion beam instrument was used to prepare single crystal copper samples oriented along [100] and [110]. Electromigration results of the single crystal samples indicate that the [100] oriented sample had better electromigration properties than the [110] oriented sample.