IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11) | |
NBS-NIST Centennial | Sunday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
NB-SuP1 Resonance Tunneling: from Field Emission to Molecular Electronics with Intermediate Stops; a Thirty Five Year NBS/NIST Saga J.W. Gadzuk, National Institute of Standards and Technology |
NB-SuP2 Scanning Tunneling Microscopy in the Electron Physics Group at NIST@footnote 1@ J.A. Stroscio, E.W. Hudson, R.J. Celotta, D.T. Pierce, National Institute of Standards and Technology |
NB-SuP3 Spin-Polarized Electrons at NBS/NIST@footnote *@ D.T. Pierce, R.J. Celotta, J. Unguris, National Institute of Standards and Technology |
NB-SuP4 Investigations of Electron Emission and Scattering Phenomena at Surfaces C.J. Powell, National Institute of Standards and Technology |
NB-SuP5 Application-Tunable Chemical Microsensors: Multicomponent Research for New Measurement Technology S. Semancik, R.E. Cavicchi, M.C. Wheeler, N.O. Savage, C.J. Taylor, National Institute of Standards and Technology |
NB-SuP6 The NIST Synchrotron Ultraviolet Radiation Facility U. Arp, M.L. Furst, E.W. Hagley, T.B. Lucatorto, C.S. Tarrio, C.W. Clark, National Institute of Standards and Technology |
NB-SuP7 Surface and Microanalysis Science Division: From XPS Standards to Near-field Optical Microscopy. R.R. Cavanagh, S.J. Stranick, C.A. Michaels, National Institute of Standards and Technology |
NB-SuP8 Surface Science at the NBS / NIST SURF-II Synchrotron Light Source R.L. Kurtz, Louisiana State University, T.E. Madey, Rutgers, The State University of New Jersey, R.L. Stockbauer, Louisiana State University |
NB-SuP9 Cluster SIMS Research at NIST J.G. Gillen, National Institute of Standards and Technology |
NB-SuP10 Triply Differential Photoelectron Spectroscopy at SURF-II R.L. Stockbauer, Louisiana State University, D.L. Ederer, Tulane University, J.B. West, Daresbury Laboratories, K. Codling, Reading University, A.C. Parr, NIST, J. Dehmer, NSF |
NB-SuP11 Future Directions of Vacuum and Low Gas-Flow Metrology at NIST A. Lee, J.P. Looney, A.P. Miiller, P.J. Abbott, National Institute of Standards and Technology |