| AVS 46th International Symposium | |
| Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | SS3+AS+NS-ThM1 Determination of Sticking Probability and Transition State Energy by Line-of-Sight Detection: Halocarbons on Cu(111) A.S.Y. Chan, C.A. Clifford, R.G. Jones, University of Nottingham, UK |
| 8:40am | SS3+AS+NS-ThM2 Demonstration of Angle Resolved Auger-photoelectron Coincidence Spectroscopy from a Solid: First Results from the Cu(111) Surface D.A. Arena, R.A. Bartynski, Rutgers University, D. Cvetko, L. Floreano, A. Morgante, F. Tommasini, Laboratorio Nazionale TASC-INFM, Italy, A. Attili, A. Ruocco, G. Stefani, Universita' di Roma, Italy, L. Marassi, P. Luches, Universita' di Modena, Italy, S. Iacobucci, CNR-IMAI, Montelibretti, Italy |
| 9:00am | SS3+AS+NS-ThM3 Multiple Atom Resonant Photoemission: A New Tool for Determining Near-Neighbor Atomic Identities and Bonding A.W. Kay, UC Davis and LBNL, E. Arenholz, LBNL and UC Berkeley, B.S. Mun, UC Davis and LBNL, J. Garcia de Abajo, LBNL, C.S. Fadley, UC Davis and LBNL, R. Denecke, Z. Hussain, M.A. Van Hove, LBNL |
| 9:20am | SS3+AS+NS-ThM4 Incident Beam Diffraction in Electron Stimulated Desorption M.T. Sieger, G.K. Schenter, T.M. Orlando, Pacific Northwest National Laboratory |
| 9:40am | SS3+AS+NS-ThM5 Invited Paper Direct Atomistic Observation of Structural Dynamics in Surfaces and Interfaces by Time-Resolved High-Resolution Transmission Electron Microscopy T. Kizuka, Nagoya University and Japan Science and Technology Corporation, Japan |
| 10:20am | SS3+AS+NS-ThM7 Ionization Mechanisms of Water in High Interfacial Electric Fields D.L. Scovell, V.K. Medvedev, C.J. Rothfuss, E.M. Stuve, University of Washington |
| 10:40am | SS3+AS+NS-ThM8 Free Electron Laser Nanospectroscopy Interface Applications G. Margaritondo, Ecole Polytecnique Fédérale, Switzerland, A. Cricenti, Consiglio Nazionale delle Ricerche, Italy, N.H. Tolk, Vanderbilt University, R. Generosi, P. Perfetti, Consiglio Nazionale delle Ricerche, Italy, I.D. Aggarwal, U.S. Naval Research Laboratory |
| 11:00am | SS3+AS+NS-ThM9 Imaging and Charge Transport Measurements using Dual-Probe Scanning Tunneling Microscopy H. Grube, J.J. Boland, University of North Carolina |
| 11:20am | SS3+AS+NS-ThM10 The Miniature Cylindrical Mirror Analyzer: A New Tool For Surface Analysis K. Grzelakowski, Focus Polska Sp. Z o.o., Poland, M.S. Altman, Hong Kong University of Science and Technology, P.R. China |
| 11:40am | SS3+AS+NS-ThM11 Investigations of Surface Reactions on Thin Film-Supported Catalysts Using Microhotplate Arrays R. Walton, R. Cavicchi, S. Semancik, M. Class, J. Allen, J. Suehle, National Institute of Standards and Technology |