AVS 46th International Symposium
    Surface Science Division Thursday Sessions
       Session SS3+AS+NS-ThM

Paper SS3+AS+NS-ThM9
Imaging and Charge Transport Measurements using Dual-Probe Scanning Tunneling Microscopy

Thursday, October 28, 1999, 11:00 am, Room 604

Session: Novel Surface Probes & Technique Enhancement
Presenter: H. Grube, University of North Carolina
Authors: H. Grube, University of North Carolina
J.J. Boland, University of North Carolina
Correspondent: Click to Email
Scanning tunneling microscopy has evolved into a valuable tool for the study of semiconductor and metal surfaces. However, the single probe geometry of STM limits its application to local and static measurements of the local density of states.@footnote 1@ Incorporation of a second electrically and mechanically independent STM tip within nanometers of the first enables measurements of surface properties that conventional STM cannot perform.@footnote 2,3,4@ Our DP-STM has been characterized by placing both tips in close proximity on a sample surface and obtaining images from each tip showing its local surface environment and the other probe. We discuss the challenges encountered of DPSTM and the feasibility of charge transport measurements on a variety of systems including carbon nanotubes. @FootnoteText@ @footnote 1@ G. Binnig et al., Phys. Rev. Lett., 49 (1), 57 (1982)@footnote 2@ Q. Niu, M. C. Chang and C. K. Shih, Phys. Rev., B 51 (8), 5502 (1995)@footnote 3@ J. M. Beyers and M. E. Flatte, Phys. Rev. Lett., 74 (2), 306 (1995)@footnote 4@ J. M. Beyers and M. E. Flatte, J. Phys. Chem. Solids., 56 (12), 1701 (1995)