AVS 46th International Symposium
    Surface Science Division Thursday Sessions
       Session SS3+AS+NS-ThM

Paper SS3+AS+NS-ThM8
Free Electron Laser Nanospectroscopy Interface Applications

Thursday, October 28, 1999, 10:40 am, Room 604

Session: Novel Surface Probes & Technique Enhancement
Presenter: G. Margaritondo, Ecole Polytecnique Fédérale, Switzerland
Authors: G. Margaritondo, Ecole Polytecnique Fédérale, Switzerland
A. Cricenti, Consiglio Nazionale delle Ricerche, Italy
N.H. Tolk, Vanderbilt University
R. Generosi, Consiglio Nazionale delle Ricerche, Italy
P. Perfetti, Consiglio Nazionale delle Ricerche, Italy
I.D. Aggarwal, U.S. Naval Research Laboratory
Correspondent: Click to Email
We present the first result of a major effort to investigate the lateral fluctuations of properties of solid interfaces on a microscopic scale. The key elements were the use of a small-tip optics fiber and its coupling with a scanning module; in this way, we achieved and verified the condition of near-field microscopy -- including a lateral resolution much below the wavelength value. Our discussion includes a presentation of the first scanning near-field optical microscopy images obtained with a free electron laser infrared sources and data on small and microscopic-scale fluctuations of semiconductor interface barriers.