| AVS 46th International Symposium | |
| Nanometer-scale Science and Technology Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | NS-TuA1 Size, Shape, Strain, and Composition Inhomogeneities of In@sub 0.5@Ga@sub 0.5@As QDs Grown by Migration Enhanced Epitaxy N. Liu, C.K. Shih, O. Baklenov, A.L. Holmes, Jr., The University of Texas at Austin |
| 2:20pm | NS-TuA2 Cross-Sectional Scanning Tunneling Microscopy as a Probe of Atomic-Scale Order in MOVPE Grown GaInP@footnote 1@ J. Steinshnider, M. Weimer, Texas A&M University, M. Hanna, National Renewable Energy Laboratory |
| 2:40pm | NS-TuA3 Interpreting Atomic-Scale Structure in Cross-Sectional STM Images of III-V Superlattices W. Barvosa-Carter, B.Z. Nosho, M.J. Yang, L.J. Whitman, Naval Research Laboratory |
| 3:00pm | NS-TuA4 The Importance of Many-body Effects in the Clustering of Charged Zn Dopant Atoms in GaAs Ph. Ebert, Forschungszentrum J@um u@lich, Germany, T.-J. Zhang, University of Tennessee, F. Kluge, M. Simon, Forschungszentrum J@um u@lich, Germany, Z. Zhang, Oak Ridge National Laboratory, K. Urban, Forschungszentrum J@um u@lich, Germany |
| 3:20pm | NS-TuA5 Invited Paper New Methods to Measure Electrical, Optical, and Magnetic Properties on the Nanometer Scale M. Aono, Osaka University and Institute of Physical and Chemical Research, Japan |
| 4:00pm | NS-TuA7 Field Dependent Electric Potential Gradients at Atomically Abrupt Oxide Interfaces D.A. Bonnell, B. Huey, S. Kalinin, University of Pennsylvania |
| 4:20pm | NS-TuA8 Dynamics of Adsorbate Islands with Nanoscale Spacial Resolution: (OH)@sub n@ Formation during the NO/H@sub 2@ Reaction on Pt(001) C. Voss, T. Visart de Bocarmé, T. Bär, N. Kruse, Université Libre de Bruxelles, Belgium |
| 4:40pm | NS-TuA9 Measuring Average Tip-sample Forces in Intermittent-contact (Tapping) Force Microscopy in Air S.C. Fain, Jr., K.A. Barry, M.G. Bush, B. Pittenger, University of Washington, R.N. Louie, Pacific Lutheran University |
| 5:00pm | NS-TuA10 Imaging the Near-field Intensity Gradients with a Tapping-mode Near-field Scanning Optical Microscope D.P. Tsai, C.W. Yang, National Chung Cheng University, Taiwan |