AVS 46th International Symposium
    Nanometer-scale Science and Technology Division Tuesday Sessions
       Session NS-TuA

Invited Paper NS-TuA5
New Methods to Measure Electrical, Optical, and Magnetic Properties on the Nanometer Scale

Tuesday, October 26, 1999, 3:20 pm, Room 612

Session: Innovative Nanoscale Measurements
Presenter: M. Aono, Osaka University and Institute of Physical and Chemical Research, Japan
Correspondent: Click to Email
In order to measure electrical, optical, and magnetic properties of materials on the nanometer scale, we have developed (a) a scanning tunneling microscope (STM) that has three tips operated independently, (b) a photon-detecting STM equipped with a polari zation analyzer, and © a spin-polarized STM with a nonmagnetic high-Z material tip, respectively. In the present paper, we show selected experimental results obtained with these apparatuses. Also we would like to show interesting experimental results on local polymerization of organic molecule in monolayer films. They include chain polymerization of diacetylene compound molecules triggered by a STM tip.