| AVS 46th International Symposium | |
| Nanometer-scale Science and Technology Division | Tuesday Sessions |
| Session NS-TuA |
| Session: | Innovative Nanoscale Measurements |
| Presenter: | Ph. Ebert, Forschungszentrum J@um u@lich, Germany |
| Authors: | Ph. Ebert, Forschungszentrum J@um u@lich, Germany T.-J. Zhang, University of Tennessee F. Kluge, Forschungszentrum J@um u@lich, Germany M. Simon, Forschungszentrum J@um u@lich, Germany Z. Zhang, Oak Ridge National Laboratory K. Urban, Forschungszentrum J@um u@lich, Germany |
| Correspondent: | Click to Email |