AVS 46th International Symposium | |
Nanometer-scale Science and Technology Division | Tuesday Sessions |
Session NS-TuA |
Session: | Innovative Nanoscale Measurements |
Presenter: | Ph. Ebert, Forschungszentrum J@um u@lich, Germany |
Authors: | Ph. Ebert, Forschungszentrum J@um u@lich, Germany T.-J. Zhang, University of Tennessee F. Kluge, Forschungszentrum J@um u@lich, Germany M. Simon, Forschungszentrum J@um u@lich, Germany Z. Zhang, Oak Ridge National Laboratory K. Urban, Forschungszentrum J@um u@lich, Germany |
Correspondent: | Click to Email |