AVS 46th International Symposium
    Nanometer-scale Science and Technology Division Tuesday Sessions
       Session NS-TuA

Paper NS-TuA7
Field Dependent Electric Potential Gradients at Atomically Abrupt Oxide Interfaces

Tuesday, October 26, 1999, 4:00 pm, Room 612

Session: Innovative Nanoscale Measurements
Presenter: D.A. Bonnell, University of Pennsylvania
Authors: D.A. Bonnell, University of Pennsylvania
B. Huey, University of Pennsylvania
S. Kalinin, University of Pennsylvania
Correspondent: Click to Email
Scanning Surface Potential Microscopy has been used to measure spatial variations in electric fields near atomically abrupt interfaces in SrTiO@sub 3@ and ZnO. The field dependence of potential gradients is determined by using microlithography to isolate regions of the interface and apply local electric fields during the measurements. The local potential drop is used to determine the interface density of states. A procedure for extracting actual interface potential from separation dependence is proposed.[100] symmetric tilt boundaries in SrTiO@sub 3@ with tilt angles ranging from 15°-60° are examined and interface potential is related to atomic structure.